HANDLER
IC Handler - Pioneer Semiconductor Machine Co., Ltd
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IC Handler
NX1032XS IC Test Handler
Developed using leading-edge robot technology, this IC test handler boasts significantly improved performance to support even the most demanding tests.
- Up to 32 site testing capability
- Testing area from 344mm x 244mm
- Up to 480kgf contact force
- UPH - up to 20,000 (Ambient)
- Up to 10,500 (High Temperature)
Type: NX1032XS
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IC Handler
NS8080SH \ NS8040SH IC Test Handler
High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.
- Up to 4/8 sites testing capability
- Testing area from 184mm x 149mm
- Up to 120kgf contact force
- UPH - up to 13,500 (ambient)
- Up to 8,200 (High Temperature)
Type: NS8080SH \ NS8040SH
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IC Handler
NS8160MS \ NS8080MS IC Test Handler
High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.
- Up to 16\8 sites testing capability
- Testing area from 264mm x 149mm
- Up to 240kgf contact force
- UPH – up to 13,500 (Ambient)
- Up to 8,200 (High Temperature)
Type: NS8160MS \ NS8080MS