NST Handler
SIMPLE AND INTELLIGENT

NS Technologies

NS Technologies is a wholly-owned subsidiary that was founded by Kanematsu and received transfer of all assets related to the Epson IC test handler business, and are continuing to operate this business as a specialist manufacturer. We also have constructed a system for providing the same services that existed before by retaining the same production and sales system both in Japan and overseas.
Flagship Model

NX1032XS FT IC Test Handler

Empowering the semiconductor testing industry with high-speed, stable, and reliable FT IC test handlers.

Ambient & Hot IC Test Handler
  • Up to 32 site testing capability
  • Testing area from 344mm x 244mm
  • Up to 480kgf contact force
  • UPH：
    Up to 20,000 UPH (Ambient)
    Up to 10,500 UPH (High Temperature)

Developed using leading-edge robot technology, this IC test handler boasts significantly improved performance to support even the most demanding tests.

SPECIFICATIONS

NX1032XS
Devices Handled 16-site 32-site
QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA,
Min. 3×3 to Max. 50×50 (Lead pitch: 0.4mm or more) *1
Test Mode N/A 32-site (8×4, X: 40mm pitch × Y: 60mm pitch)
16-site (8×2, X: 30mm pitch Y: 60mm pitch, 40mm pitch × Y: 60mm pitch)
8-site (4×2, X: 40mm pitch × Y: 60mm, X: 60mm pitch × Y: 60mm, X: 80mm pitch × Y: 60mm)
4-site (2×2, X: 80mm × Y: 60mm), (4×1, X: 40mm, 60mm, 80mm)
2-site (Socket pitch 80 mm)
Single (use one side of the 2-site test)
Non-standard pitches can be set by laying out the independent compliance unit with desired pitches
Testing Area 344 × 146 mm 344 × 244 mm
Standard Socket Pitch (mm) X: 40mm Y: 60mm
Heating Method Heat Press Method
Index Time *2
(common in Ambient and High Temperature modes)		 Min. 0.38sec
Approx. 0.42sec. (wide 4×2, 8×2 layout) Approx. 2.05sec. (8×4 layout)
Approx. 2.21sec. (4,800N Option) Approx. 4.35sec. (4,800N Option)
Max. Contact Force 1,600N (Optional) or 4,800N (Standard) 3,200N (Optional) or 4,800N (Standard)
Maximum Throughput (units per hour) 8×4 and 8×2 layouts: 20,000, 4×2 layout: 15,000(ambient temperature)
8×4 and 8×2 layouts: 10,500, 4×2 layout:10,500(high temperature)
Binning Max. 6 bins (Auto 3, Manual 3)
Tray JEDEC (135.9 × 315.0 mm)
Temperature Accuracy +50°C to +90°C ±2°C
+90°C to 155°C ±3°C
Hot Plate Size 220mm × 380 mm *3
Power Requirement Single Phase AC 200 - 240 V, 50/60 Hz, 6 kVA
Handler Dimensions (mm) (W x D x H) 1,580(W) x 1,940(D) x 2,000(H) *4
Weight Approx. 1,200kg
Note:

*1:Depends on socker size and socker pitch.
*2:Depends on the socker mounting height.
*3:Excluding handle, tower light, and LCD monitor.
*4:Contact us for temperature accuracy of NS8080SH- 8-site.
Basic Model

NS8080SH / NS8040SH FT IC Test Handler

Delivering a high-speed, stable testing environment for FT IC sorting — ensuring exceptional reliability and performance in every operation.

Ambient & Hot IC Test Handler
  • Up to 4/8 site testing capability
  • Testing area from 184mm x 149mm
  • Up to 120kgf contact force
  • UPH：
    Up to 13,500 UPH (Ambient)
    Up to 8,200 UPH (High Temperature)

SPECIFICATIONS

NS8160MS NS8080MS NS8080SH NS8040SH
Devices Handled QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA
Min. 3 x 3 to Max. 50 x 50 (Lead pitch: 0.4mm or more) *1
Test Mode 16-site (8 x 2)
 N/A N/A N/A
8-site (4 x 2) N/A
Square 4-site (2 x 2)
In-Line 4-site (4 x 1)
2-site
Single
Testing Area 264 mm x 149 mm 184 mm x 149 mm
Standard Socket Pitch (mm) X: 30 Y: 60(max X: 30 Y: 63.5) X: 40 Y: 60(max X: 60 Y: 63.5) X: 40 Y: 60 X: 80 Y: 60
Heating Method Heating Plate
Index Time 0.42 sec (up to 160 kgf)*2 0.4 sec (up to 120 kgf)*2
0.58 sec (up to 240 kgf)*2 N/A
Maximum Throughput (units per hour)
 13,500 units(ambient temperature)
8,200 units(high temperature)		 10,000 units(ambient Temperature)
6,100 units(high temperature)
Binning Max. 6 bins (Auto 3, Manual 3)
Tray Size JEDEC (135.9 x 315.0 mm)
Max. Contact Pressure 240 kgf 120 kgf
Temperature Accuracy +50°C to +90°C ±2°C *4
+90°C to +155°C ±3°C *4		 +50°C to +90°C ±2°C
+90°C to +130°C ±3°C
Power Single Phase AC 200 - 240 V, 50/60 Hz, 6 kVA
Handler Dimensions (mm) (W x D x H) 1,850(W) x 1,500(D) x 1,970(H) *3 1,850(W) x 1,500(D) x 1,850(H) *3
Weight Approx. 1,090kg Approx. 1,000kg
Note:

*1:Depends on socker size and socker pitch.
*2:Depends on the socker mounting height.
*3:Excluding handle, tower light, and LCD monitor.
*4:Contact us for temperature accuracy of NS8080SH- 8-site.
Mainstream Model

NS8160MS / NS8080MS FT IC Test Handler

Delivering a high-speed, stable testing environment for FT IC sorting — ensuring exceptional reliability and performance in every operation.

Ambient & Hot IC Test Handler
  • Up to 4/8 site testing capability
  • Testing area from 184mm x 149mm
  • Up to 120kgf contact force
  • UPH：
    Up to 13,500 UPH (Ambient)
    Up to 8,200 UPH (High Temperature)

SPECIFICATIONS

NS8160MS NS8080MS NS8080SH NS8040SH
Devices Handled QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, PGA
Min. 3 x 3 to Max. 50 x 50 (Lead pitch: 0.4mm or more) *1
Test Mode 16-site (8 x 2)
 N/A N/A N/A
8-site (4 x 2) N/A
Square 4-site (2 x 2)
In-Line 4-site (4 x 1)
2-site
Single
Testing Area 264 mm x 149 mm 184 mm x 149 mm
Standard Socket Pitch (mm) X: 30 Y: 60(max X: 30 Y: 63.5) X: 40 Y: 60(max X: 60 Y: 63.5) X: 40 Y: 60 X: 80 Y: 60
Heating Method Heating Plate
Index Time 0.42 sec (up to 160 kgf)*2 0.4 sec (up to 120 kgf)*2
0.58 sec (up to 240 kgf)*2 N/A
Maximum Throughput (units per hour)
 13,500 units(ambient temperature)
8,200 units(high temperature)		 10,000 units(ambient Temperature)
6,100 units(high temperature)
Binning Max. 6 bins (Auto 3, Manual 3)
Tray Size JEDEC (135.9 x 315.0 mm)
Max. Contact Pressure 240 kgf 120 kgf
Temperature Accuracy +50°C to +90°C ±2°C *4
+90°C to +155°C ±3°C *4		 +50°C to +90°C ±2°C
+90°C to +130°C ±3°C
Power Single Phase AC 200 - 240 V, 50/60 Hz, 6 kVA
Handler Dimensions (mm) (W x D x H) 1,850(W) x 1,500(D) x 1,970(H) *3 1,850(W) x 1,500(D) x 1,850(H) *3
Weight Approx. 1,090kg Approx. 1,000kg
Note:

*1:Depends on socker size and socker pitch.
*2:Depends on the socker mounting height.
*3:Excluding handle, tower light, and LCD monitor.
*4:Contact us for temperature accuracy of NS8080SH- 8-site.
TRI-TEMP MODEL

NS8080MT / NS8160GT FT IC Test Handler

High throughput to support the testing of Automotive chips.

Tri-Temp IC Test Handler
  • Temperature from -55C to 175C
  • Up to 8/16 Site testing capability
  • Testing Area:
    MT: X344mm / Y149mm
    GT：X344mm / Y244mm
  • Up to 240 kgf contact force
  • Up to 7,750 UPH (Cold Temperature)

SPECIFICATIONS

NS8080MT NS8160GT
Jam rate < 1/10,000
Index Time 0.7 sec(Direct) / 0.9 sec(Soft)
Single Arm Contact
0.7 sec(Direct) / 0.9 sec(Soft)
Double Arm Contact
3.0 sec(Direct) / 3.3 sec(Soft)
Max UPH
(Test time 0sec) 		Contact: Single Arm Single Arm Double Arm
Cold: 7,750 7,750 6,850
Hot: 7,800 7,800 6,850
Amb: 11,150 11,150 9,600
8 site 4x2 8 site 4x2 16 site 4x4
Dimensions & Weight 2233mm(W) x 1723mm(D) x 2163mm(H)
2350kg(include refrigerators inside)
Temperature Range Hot: +90℃～130℃, Stability Test hand:+/-3℃, other:+/-5℃    175℃(Option)
Hot: +30℃～+90℃, Stability Test hand:+/-2℃, other:+/-5℃
Cold: -55℃～+25℃, Stability Test hand:+/-2℃, other:+/-5℃
Change Kit Change Time Approximately<30 min. (switch to existing recipe)
ESD ability Balance ±10V, 1kV　→　100V within 5sec
ESD with feedback Balance ±5V, 1kV→100V within 5sec  (Option)
Electricity Power Supply Heater: 200~240V±10%, 50/60Hz, 75A, 16.8kVA
Refrigerator: 200~240V±10%, 50/60Hz, 75A, 16.8kVA
Handler: 200~240V±10%, 50/60Hz, 30A, 4.8kVA
Compressed Air Supply Dew Point Temperature -60℃,  0.5MPa, 1300NL/min
Socket Layout 8site(X4/Y2) 16site(X4/Y4)
Socket Area Size[mm] X344 / Y149 X344 / Y244
Shuttle Size[mm] X234 / Y120 X234 / Y120
Max Contact Force 2400 N/Arm 2400 N/Arm
Index Motion Single Arm Contact
(Contact alternately with Two Arm) 		Single Arm Contact Double Arm Contact
(2arms contact simultaneously)
Socket Pitch[mm] 1site (X1) X60mm offset from center of socket area ← －
2site(X2/Y1) X120,80 ← －
4site (X4/Y1) X60,40 ← －
4site (X2/Y2) X120,80,60　/ Y60 ← －
8site (X4/Y2) X60 / Y60, 80 ← －
16site (X4/Y4) － － X40/Y60,X60/Y60,
X40/Y40
16site (X8/Y2) － －
32site (X8/Y4) － －
NST Handler
© Pioneer Semiconductor Machine Co., Ltd.