semiconductor

分類測試機

商用系列提供創新的IC測試分類機方案,反映日益快速的半導體產品週期。

  • IC Handler

    NX1032XS IC Test Handler

    Developed using leading-edge robot technology, this IC test handler boasts significantly improved performance to support even the most demanding tests.

    • Up to 32 site testing capability
    • Testing area from 344mm x 244mm
    • Up to 480kgf contact force
    • UPH - up to 20,000 (Ambient)
    • Up to 10,500 (High Temperature)
    機型: NX1032XS
  • IC Handler

    NS8080SH \ NS8040SH IC Test Handler

    High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.

    • Up to 4/8 sites testing capability
    • Testing area from 184mm x 149mm
    • Up to 120Kgf contact force
    • UPH - up to 13,500 (ambient)
    • Up to 8,200 (High Temperature)
    機型: NS8080SH \ NS8040SH
  • IC Handler

    NS8160MS \ NS8080MS IC Test Handler

    High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.

    • Up to 16\8 sites testing capability
    • Testing area from 264mm x 149mm
    • Up to 240kgf contact force
    • UPH – up to 13,500 (Ambient)
    • Up to 8,200 (High Temperature)
    機型: NS8160MS \ NS8080MS